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Focused ion beam
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81	PDF Document Add to Reading List Source URL: nanomelbourne.com Language: English - Date: 2012-08-28 20:21:24 Focused ion beam Semiconductor device fabrication Thin film deposition Fib Melbourne Centre for Nanofabrication Nanowire Scanning electron microscope Nanolithography Sridhar Scientific method Electron microscopy Science
82	CSEM’s Materials Monthly November[removed]Making materials matter Add to Reading List Source URL: www.anu.edu.au Language: English - Date: 2003-11-24 23:23:22 Electron microscopy Microscopy Focused ion beam Optical microscope Microscope Electron microscope Melamine Confocal microscopy Scanning electron microscope Scientific method Science Chemistry
83	CSEM’s Materials Monthly July[removed]Making materials matter Add to Reading List Source URL: www.anu.edu.au Language: English - Date: 2004-07-27 23:58:00 Photonics Electron microscopy Nanomaterials Emerging technologies Focused ion beam Photonic crystal Centre for Ultrahigh Bandwidth Devices for Optical Systems Nanophotonics Nanotechnology Physics Science Optics
84	Fraunhofer Institute for Reliability and M i c r o i n t e g r at i o n I Z M Focused Ion Beam • Design parameter effect analysis (geometry, material, load profile) Add to Reading List Source URL: www.izm.fraunhofer.de Language: English - Date: 2015-03-18 10:12:33 Reliability Measuring instrument Thermomechanical analysis Failure analysis Electron microscope Dynamic mechanical analysis Atomic force microscopy Characterization MIL-STD-883 Science Materials science Scientific method
85	CSEM’s Materials Monthly September[removed]Making materials matter Add to Reading List Source URL: www.anu.edu.au Language: English - Date: 2003-09-16 23:27:52 Electron microscopy Semiconductor device fabrication Ions Plasma physics Thin film deposition Plasma Focused ion beam Ion beam Thin film Scientific method Physics Chemistry
86	Focused ion beam preparation and characterization of single-crystal samples for high-pressure experiments in the diamond-anvil cell Add to Reading List Source URL: www.minsocam.org Language: English - Date: 2012-01-31 11:29:41 Science Semiconductor device fabrication Thin film deposition Electron beam Microscopes Focused ion beam Transmission electron microscopy Electron microscope Brillouin scattering Scientific method Electron microscopy Physics
87	IEEE ELECTRON DEVICE LETTERS, VOL. 34, NO. 11, NOVEMBER[removed]Antimonide-Based Heterostructure p-Channel MOSFETs With Ni-Alloy Source/Drain Add to Reading List Source URL: www.nrl.navy.mil Language: English - Date: 2013-11-26 12:58:30 Compound semiconductors Inorganic compounds Transistor MOSFET Gallium arsenide Schottky diode Schottky barrier Light-emitting diode Focused ion beam Chemistry Electronics Semiconductor devices
88	Waseem Asghar Department of Electrical Engineering, Nanotechnology Research and Teaching Facility, University of Texas at Arlington, Arlington, TX 76019 Add to Reading List Source URL: www.uta.edu Language: English - Date: 2012-08-17 04:38:47 Nanoelectronics Semiconductor device fabrication Thin film deposition Molecular electronics Nanotechnology Focused ion beam Break junction Electromigration Ion beam Electromagnetism Physics Electronics
89	Asghar et al. Nanoscale Research Letters 2011, 6:372 http://www.nanoscalereslett.com/content[removed]NANO EXPRESS Open Access Add to Reading List Source URL: www.uta.edu Language: English - Date: 2011-06-03 17:15:28 Electron microscopy Chemistry Ion-beam sculpting Nanopore Transmission electron microscopy Focused ion beam Electron microscope Membrane Microelectromechanical systems Nanotechnology Scientific method Science
90	IEEE TRANSACTIONS ON MAGNETICS, VOL. 38, NO. 5, SEPTEMBER[removed]The CantiClever: A Dedicated Probe for Magnetic Force Microscopy Add to Reading List Source URL: doc.utwente.nl Language: English - Date: 2011-08-28 10:51:13 Chemistry Nanotechnology Magnetic force microscope Atomic force microscopy Cantilever Focused ion beam Microscopy Scanning joule expansion microscopy Thermal Probe Lithography Scientific method Scanning probe microscopy Science